Page 580 - MiSUMi FA Mechanical Components Economy Series
P. 580
Probe type electrical characteristic inspection device
Application Industries: Electronic & Electrical Semiconductor
In this figure, the workpiece supplied by the robot is moved to 2 workpieces dropping
tables, and the probe holder is moved to the inspection position.
It is commonly used for continuity inspection and circuit testing of electronic circuits in the
semiconductor industry.
01 Angle Plate ×1 02 Proximity Sensor ×2
04 Actuator ×1 03 Contact Probe NP58×2
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